Analysis of Test Application Time for Test Data Compression Methods Based on Compression Codes
نویسندگان
چکیده
منابع مشابه
Analysis of Test Application Time for Test Data Compression Methods Based on Compression Codes
We present an analysis of test application time for test data compression techniques that are used for reducing test data volume and testing time in system-on-a-chip (SOC) designs. These techniques are based on data compression codes and on-chip decompression. The compression/decompression scheme decreases test data volume and the amount of data that has to be transported from the tester to the...
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ژورنال
عنوان ژورنال: Journal of Electronic Testing
سال: 2004
ISSN: 0923-8174
DOI: 10.1023/b:jett.0000023682.41142.44